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| thorough device analysis |
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reliability testing
To achieve perfection in the products manufactured, Central performs reliability testing consisting of environmental and life tests, simulating the adverse conditions devices might encounter throughout their life. |
Temperature Cycling |
| device failure analysis
If a failure does occur, Central has the
capability to thoroughly analyze a device and determine the root cause. The Nicolet Real Time
X-Ray affords the ability to view a device's internal construction without the need for deconstruction. Where device deconstruction is required, a de-capsulation system using sulfuric acid is used to gain a complete view
of
the interior of a device. |
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Device Deconstruction System |
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device qualification
During the development process and before a device is released for production, extensive qualification tests are performed which include, electrical, mechanical, environmental, and life tests. In addition, die and wire bond strengths are determined and compared to strict standards. |
| Die Shear/Wire Pull System |
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145 Adams Avenue
Hauppauge, NY 11788 USA
TEL (631) 435-1110
FAX (631) 435-1824 |